Title
Advances in Metrology for X-Ray and EUV
Author
Assoufid, Lahsen
ISBN
9780819492180
| Title Name: | Advances in Metrology for X-Ray and EUV |
|---|---|
| Author: | Assoufid, Lahsen |
| Publisher: | Eurospan |
| ISBN: | 9780819492180 |
| Substitute ISBN: | |
| Stock Status: | APPLY DIRECT TO PUB |
| Format: | PAPERBACK |
| Product Type: | |
| Publication Date: | 30/11/2012 |
| Australian RRP (GST inc): | $102.30 |
| New Zealand RRP (GST inc): | $112.53 |
| Availability: | OUT OF STOCK |
| Stock on order: | NO |
| Order ETA date: | Unavailable |
| Will stock be available after all backorders are fulfilled?: |
|
| Warehouse ETA date: | Unavailable |
| Indent ETA date: |
