Title
X-Ray Metrology Semiconductor Manufactur
Author
BOWEN
ISBN
9780849339288
| Title Name: | X-Ray Metrology Semiconductor Manufactur |
|---|---|
| Author: | BOWEN |
| Publisher: | Taylor & Francis Group |
| ISBN: | 9780849339288 |
| Substitute ISBN: | |
| Stock Status: | STOCK TITLE |
| Format: | Hardback |
| Product Type: | Library/Reference |
| Publication Date: | 24/01/2006 |
| Australian RRP (GST inc): | $378.00 |
| New Zealand RRP (GST inc): | $423.00 |
| Availability: | OUT OF STOCK |
| Stock on order: | NO |
| Order ETA date: | Unavailable |
| Will stock be available after all backorders are fulfilled?: |
|
| Warehouse ETA date: | Unavailable |
| Indent ETA date: |
