Title
Testing Small-Delay Defects Nanoscale CM
Author
GOEL
ISBN
9781138075771
| Title Name: | Testing Small-Delay Defects Nanoscale CM |
|---|---|
| Author: | GOEL |
| Publisher: | Taylor & Francis Group |
| ISBN: | 9781138075771 |
| Substitute ISBN: | |
| Stock Status: | STOCK TITLE |
| Format: | Paperback |
| Product Type: | Library/Reference |
| Publication Date: | 29/03/2017 |
| Australian RRP (GST inc): | $173.00 |
| New Zealand RRP (GST inc): | $193.00 |
| Availability: | OUT OF STOCK |
| Stock on order: | NO |
| Order ETA date: | Unavailable |
| Will stock be available after all backorders are fulfilled?: |
|
| Warehouse ETA date: | Unavailable |
| Indent ETA date: |
